Courtesy of NASA

We provide a variety of services geared to evaluate device/system susceptibilities to ionizing radiation.

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Development of customizable test vehicles and test plans:

• Test vehicles are created to enhance radiation data abstraction and reliability.

• Test vehicles are of superior quality due to their ability to mimic full system operation for the target device under test (DUT).

• Test vehicles are designed using strict design rules regarding: synchronous behavior, clock domain crossings, metastability, DUT signal monitoring, DUT signal capture, signal integrity, and complex data reporting.

• Radiation test facility nuances are taken into account for test vehicle and test plan development.

• Test vehicles can be created to evaluate a variety of DUTs for their susceptibility to ionization.  The following are examples of DUTs:

  • Field programmable gate arrays (FPGAs – SRAM, flash, and anti-fuse)

  • Memories (SRAM, SDRAM, DRAM, DDRn, MRAM, reRAM, etc.)

  • Analog to digital converters (ADCs – serial or parallel)

  • Sensors

  • Microprocessors

  • ASICs

  • Oscillators

Creation of DUT hardware:

• Custom daughter boards are populated with the DUT .  They strategically interface to the customized test vehicle (Mother board).

• Board interfaces use top grade, reliable connectors that are capable of high frequency data transmission (serial and parallel).

• DUT boards are robustly designed to withstand a variety of radiation particle exposures (neutron, proton, heavy ion, strategic dose, and total ionizing dose) with minimal complication or damage from alternate populated components.

Development of FPGA DUT designs:

• We have the ability to implement designs specific to customer DUT application.

• DUT designs can range from common/simple shift registers to complex system on a chip (SoC) implementations.  SoC’s can contain elements such as microprocessors, analog components, and other complex intellectual property (IP).

Management and evaluation of Radiation test data:

• Data are organized and analyzed to fit our customers' needs.

• Evaluation includes: error rate prediction, system reliable and survivability prediction, and potential error signatures.

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We are able to provide superior data analysis because of our robust test vehicles and their detailed reporting of DUT ionization responses